DocumentCode
2082877
Title
The bonded wafer silicon on insulator approach to high performance low power integrated circuits
Author
Saul, P.H.
Author_Institution
Elettronica Ltd., UK
fYear
1995
fDate
34744
Firstpage
42461
Lastpage
42466
Abstract
This paper describes R.F. circuits designed on a silicon on insulator (SOI) process. In circuit terms, compared with bulk silicon processes, SOI offers the advantages of low parasitic capacitance per transistor and small active area for a specific critical dimension, which can be translated into small chip area and hence, ultimately, high yield. It can also enable wide bandwidth operation at low power levels. The circuits have shown wider R.F. bandwidth, faster switching time and even lower noise performance than their bulk equivalents
Keywords
bipolar integrated circuits; integrated circuit technology; silicon-on-insulator; wafer bonding; RF bandwidth; RF circuits; SOI; Si; active area; bipolar transistor; bonded wafer silicon on insulator; chip area; critical dimension; low power integrated circuits; noise; parasitic capacitance; switching time; yield;
fLanguage
English
Publisher
iet
Conference_Titel
Advanced MOS and Bi-Polar Devices, IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19950180
Filename
473097
Link To Document