DocumentCode :
2082877
Title :
The bonded wafer silicon on insulator approach to high performance low power integrated circuits
Author :
Saul, P.H.
Author_Institution :
Elettronica Ltd., UK
fYear :
1995
fDate :
34744
Firstpage :
42461
Lastpage :
42466
Abstract :
This paper describes R.F. circuits designed on a silicon on insulator (SOI) process. In circuit terms, compared with bulk silicon processes, SOI offers the advantages of low parasitic capacitance per transistor and small active area for a specific critical dimension, which can be translated into small chip area and hence, ultimately, high yield. It can also enable wide bandwidth operation at low power levels. The circuits have shown wider R.F. bandwidth, faster switching time and even lower noise performance than their bulk equivalents
Keywords :
bipolar integrated circuits; integrated circuit technology; silicon-on-insulator; wafer bonding; RF bandwidth; RF circuits; SOI; Si; active area; bipolar transistor; bonded wafer silicon on insulator; chip area; critical dimension; low power integrated circuits; noise; parasitic capacitance; switching time; yield;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Advanced MOS and Bi-Polar Devices, IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19950180
Filename :
473097
Link To Document :
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