• DocumentCode
    2082877
  • Title

    The bonded wafer silicon on insulator approach to high performance low power integrated circuits

  • Author

    Saul, P.H.

  • Author_Institution
    Elettronica Ltd., UK
  • fYear
    1995
  • fDate
    34744
  • Firstpage
    42461
  • Lastpage
    42466
  • Abstract
    This paper describes R.F. circuits designed on a silicon on insulator (SOI) process. In circuit terms, compared with bulk silicon processes, SOI offers the advantages of low parasitic capacitance per transistor and small active area for a specific critical dimension, which can be translated into small chip area and hence, ultimately, high yield. It can also enable wide bandwidth operation at low power levels. The circuits have shown wider R.F. bandwidth, faster switching time and even lower noise performance than their bulk equivalents
  • Keywords
    bipolar integrated circuits; integrated circuit technology; silicon-on-insulator; wafer bonding; RF bandwidth; RF circuits; SOI; Si; active area; bipolar transistor; bonded wafer silicon on insulator; chip area; critical dimension; low power integrated circuits; noise; parasitic capacitance; switching time; yield;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Advanced MOS and Bi-Polar Devices, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19950180
  • Filename
    473097