Title :
Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems
Author :
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Pellish, Jonathan A. ; Lauenstein, Jean-Marie ; Chen, Dakai ; Marshall, Cheryl J. ; Oldham, Timothy R. ; Kim, Hak S. ; Phan, Anthony M. ; Berg, Melanie D. ; Campola, Michael J. ; Sanders, Anthony B. ; Marshall, Pau
Author_Institution :
NASA Goddard Space Flight Center (GSFC), MEI Technol. Inc., Greenbelt, MD, USA
Abstract :
We present the results of single event effects (SEE) testing and investigating the effects of space radiation on electronics. This paper is a summary of test results.
Keywords :
aerospace testing; ion beam effects; laser beam effects; space vehicle electronics; NASA space system electronics; single event effects testing; space radiation; CMOS integrated circuits; CMOS technology; Laboratories; Laser beams; MOSFET circuits; NASA; Protons;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062500
