Title :
Dependability evaluation of complex embedded systems and microsystems
Author :
Malassé, Olaf ; Buchheit, Grégory ; Pock, Michael ; Walter, Max
Author_Institution :
A3SI, Arts et Metiers ParisTech, France
Abstract :
The evaluation of the dependability performance (RAMS) of complex embedded systems requires the development of new approaches. In software-intensive systems, the dependability structure of the functions depends on the software. The search of fault sequences must involve software and hardware. The proposed method contributes to the qualitative and quantitative safety analysis of systems and micro-systems.
Keywords :
embedded systems; micromechanical devices; performance evaluation; safety-critical software; RAMS; complex embedded systems; dependability evaluation; fault sequences; microsystems; safety analysis; software intensive systems; Art; Automata; Availability; Control systems; Embedded system; Hardware; Maintenance; Performance analysis; Process design; Safety; Binary Decision Diagram; Finite State Automaton; RAMS analysis; SW/HW analysis; complex systems;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
DOI :
10.1109/RAMS.2010.5447976
