Title :
Compendium of Recent Total Ionizing Dose Test Results Conducted by the Jet Propulsion Laboratory from 2009-2011
Author :
Bowles-Martinez, J.N. ; Thorbourn, D.O. ; Rax, B.G. ; Kenna, A.J. ; Harris, R.D. ; Scheick, L.Z. ; Allen, G.R. ; McClure, S.S.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper reports on the Total Ionizing Dose results for tests performed at JPL from 2009 to 2011. Various microelectronic devices were evaluated to support upcoming missions and research and development projects.
Keywords :
integrated circuit testing; integrated circuits; radiation effects; Jet Propulsion Laboratory; ionizing dose test results; microelectronic devices; total ionizing dose; Degradation; Laboratories; Performance evaluation; Pollution measurement; Propulsion; Radiation effects;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062502
