• DocumentCode
    2083142
  • Title

    Life and reliability forecasting of the CSADT using Support Vector Machines

  • Author

    Li, Shuzhen ; Li, Xiaoyang ; Jiang, Tongmin

  • Author_Institution
    Dept. of Syst. Eng., Beihang Univ., Beijing, China
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Accelerated Degradation Testing (ADT) is now adopted frequently to verify the reliability and life of high-reliable, long-life product. But ADT data analysis methods are still deficiency. Due to the excellent capable of little sample learning and nonlinear mapping, SVM prediction model is widely used in many fields. In this paper, a new degradation prediction method based on Support Vector Machines (SVM) is proposed and developed to predict time-to-failure of product. This prediction method is also compared with BPANN and regression methods to validate its effectiveness. Moreover, Constant Stress ADT is studied and ADT data are divided into several sets of performance degradation under different stress levels. Using SVM prediction method, all degradation processes are predicted to failure and lifetimes are obtained easily, then life and reliability under normal condition are evaluated by accelerated model. Simulation case demonstrates that the life and reliability prediction for CSADT based on SVM is reasonable and validity.
  • Keywords
    backpropagation; failure analysis; life testing; neural nets; production engineering computing; regression analysis; reliability; remaining life assessment; support vector machines; BPANN; CSADT; SVM prediction model; accelerated degradation testing; backpropagation artificial neural network; constant stress ADT data analysis methods; failure prediction; nonlinear mapping; product life prediction; regression methods; reliability forecasting; support vector machines; Acceleration; Artificial neural networks; Data engineering; Degradation; Life estimation; Life testing; Predictive models; Stress; Support vector machine classification; Support vector machines; Accelerated degradation testing; SVM; life prediction; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5447978
  • Filename
    5447978