• DocumentCode
    2083151
  • Title

    Total Dose Test Results for CubeSat Electronics

  • Author

    Avery, Keith ; Finchel, Jeffery ; Mee, Jesse ; Kemp, William ; Netzer, Richard ; Elkins, Donald ; Zufelt, Brian ; Alexander, David

  • Author_Institution
    Air Force Res. Lab., Kirtland AFB, NM, USA
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    CubeSats are increasingly important for space research. Their low orbits and short mission durations permit using electronics with modest radiation failure thresholds. Total ionizing dose irradiation results are presented for microelectronics interesting for CubeSat applications.
  • Keywords
    MOSFET; integrated circuit testing; microcontrollers; multiplying circuits; radiation effects; space vehicle electronics; CubeSat electronics; microelectronics; radiation failure thresholds; short mission durations; space research; total dose test; total ionizing dose irradiation; Annealing; EPROM; Electronics packaging; Microcontrollers; Multiplexing; Performance evaluation; Radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062504
  • Filename
    6062504
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083151