Title :
A Summary of Single Event Upset Testing of CD4000 Series Devices
Author :
Lombardi, Robert E. ; Bogorad, Alexander L. ; Likar, Justin J. ; Rubin, Aaron S. ; Camacho, Carlos F.
Author_Institution :
Lockheed Martin Space Syst. Co., Newtown, PA, USA
Abstract :
The results of single event upset (SEU) testing show that HCC4011, HCC4013, and HCC4066 devices are susceptible to transients only, HCC4020B is susceptible to bit upsets, and HCC4041 is immune to single event effects (SEE).
Keywords :
CMOS digital integrated circuits; integrated circuit testing; CD4000 Series Devices; CMOS digital devices; CMOS quad 2-input NAND gate; CMOS quad bilateral switch; CMOS ripple-carry binary counter; HCC4011 device; HCC4013 device; HCC4020B device; HCC4066 device; single event upset testing; CMOS integrated circuits; Monitoring; Radiation detectors; Single event upset; Software; Testing; Transient analysis;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062505
