DocumentCode :
2083205
Title :
A RF CMOS amplifier with optimized gain, noise, linearity and return losses for UWB applications
Author :
Nguyen, Giang D. ; Cimino, Kurt ; Feng, Milton
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois, Univ., Urbana, IL
fYear :
2008
fDate :
June 17 2008-April 17 2008
Firstpage :
505
Lastpage :
508
Abstract :
Trade-off between noise figure (NF) and input return loss (RL or |S11|) imposes a fundamental limitation on the design of low noise amplifiers (LNA) for ultra-wideband (UWB) applications. A graph-based approach using Smith Chart to achieve optimum values for both NF and input RL over the desired LNA bandwidth is presented. The proposed method and device optimization technique are systematically incorporated to enhance the overall LNA performance in terms of gain, noise, linearity, and power consumption. An UWB LNA prototype is implemented in a 0.13 mum CMOS process to demonstrate the use of this methodology. It shows a gain of 11.3 dB, a NF of 3.9-4.6 dB, and an IIP3 of 3.2-5 dBm over a -3 dB bandwidth of 2.2-9 GHz while consuming 30 mW from a 1.2 V DC supply.
Keywords :
CMOS integrated circuits; low noise amplifiers; radiofrequency amplifiers; radiofrequency integrated circuits; ultra wideband technology; RF CMOS amplifier; Smith Chart; UWB LNA; bandwidth 2.2 GHz to 9 GHz; gain 11.3 dB; input return loss; low noise amplifiers; noise figure; noise figure 3.9 dB to 4.6 dB; power 30 mW; size 0.13 micron; voltage 1.2 V; Bandwidth; Linearity; Low-noise amplifiers; Noise figure; Noise measurement; Optimization methods; Performance gain; Radio frequency; Radiofrequency amplifiers; Ultra wideband technology; CMOS; Smith chart; low noise amplifier (LNA); noise matching; ultrawideband (UWB);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE
Conference_Location :
Atlanta, GA
ISSN :
1529-2517
Print_ISBN :
978-1-4244-1808-4
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2008.4561487
Filename :
4561487
Link To Document :
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