Microstructural studies of direct-overwrite (DOW) Ag-In-Sb-Te phase-change optical recording media

Author

Price, S.J. ; Greer, A.L. ; Davies, C.E.

Author_Institution

Dept. of Mater. Sci. & Metall., Cambridge Univ., UK

fYear

2000

fDate

14-17 May 2000

Firstpage

104

Lastpage

106

Abstract

Transmission electron microscopy has been used successfully to investigate the evolution of microstructure and crystalline phase selection during repeated direct-overwriting of Ag-In-Sb-Te phase-change optical recording media. It has been shown that the mark shape is partly determined by the multipulse beam used in writing and crystallization of the edges of the molten area, due to the thermal influence of the following pulse.

Keywords

antimony alloys; crystallisation; indium alloys; optical storage; silver alloys; solid-state phase transformations; storage media; terbium alloys; transmission electron microscopy; Ag-In-Sb-Te; Ag-In-Sb-Te phase-change optical recording media; TEM; crystalline phase selection; crystallization; direct-overwrite; following pulse; mark shape; microstructural studies; microstructure; molten area; multipulse beam; repeated direct-overwriting; thermal influence; transmission electron microscopy; Amorphous materials; Crystal microstructure; Crystalline materials; Crystallization; Lattices; Optical recording; Protection; Shape; Transmission electron microscopy; Writing;

fLanguage

English

Publisher

ieee

Conference_Titel

Optical Data Storage, 2000. Conference Digest

Conference_Location

Whisler, BC, Canada

Print_ISBN

0-7803-5950-X

Type

conf

DOI

10.1109/ODS.2000.847995

Filename

847995