Title :
Microstructural studies of direct-overwrite (DOW) Ag-In-Sb-Te phase-change optical recording media
Author :
Price, S.J. ; Greer, A.L. ; Davies, C.E.
Author_Institution :
Dept. of Mater. Sci. & Metall., Cambridge Univ., UK
Abstract :
Transmission electron microscopy has been used successfully to investigate the evolution of microstructure and crystalline phase selection during repeated direct-overwriting of Ag-In-Sb-Te phase-change optical recording media. It has been shown that the mark shape is partly determined by the multipulse beam used in writing and crystallization of the edges of the molten area, due to the thermal influence of the following pulse.
Keywords :
antimony alloys; crystallisation; indium alloys; optical storage; silver alloys; solid-state phase transformations; storage media; terbium alloys; transmission electron microscopy; Ag-In-Sb-Te; Ag-In-Sb-Te phase-change optical recording media; TEM; crystalline phase selection; crystallization; direct-overwrite; following pulse; mark shape; microstructural studies; microstructure; molten area; multipulse beam; repeated direct-overwriting; thermal influence; transmission electron microscopy; Amorphous materials; Crystal microstructure; Crystalline materials; Crystallization; Lattices; Optical recording; Protection; Shape; Transmission electron microscopy; Writing;
Conference_Titel :
Optical Data Storage, 2000. Conference Digest
Conference_Location :
Whisler, BC, Canada
Print_ISBN :
0-7803-5950-X
DOI :
10.1109/ODS.2000.847995
