• DocumentCode
    2083220
  • Title

    Single Event Upset Characterization of a Mixed-Signal Field Programmable Gate Array Using Proton Irradiation

  • Author

    Hiemstra, David M. ; Gill, Prab

  • Author_Institution
    MDA, Brampton, ON, Canada
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Proton induced SEU cross-sections of certain functional blocks of a mixed-signal flash field programmable gate array are presented. Upset rates in the space radiation environment are estimated.
  • Keywords
    field programmable gate arrays; logic design; radiation hardening (electronics); flash FPGA; mixed-signal field programmable gate array; proton induced SEU cross-section; proton irradiation; single event upset characterization; space radiation environment; Flash memory; Light emitting diodes; Logic gates; Protons; Radiation effects; Random access memory; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062509
  • Filename
    6062509
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083220