Title :
Radiation Characterization of Microsemi ProASIC3 Flash FPGA Family
Author :
Poivey, C. ; Grandjean, M. ; Guerre, F.-X.
Author_Institution :
ESA ESTEC, Noordwijk, Netherlands
Abstract :
We present radiation data, Heavy ion and proton induced Single Event Effects (SEE) and Total Ionizing Dose (TID), on the Microsemi ProASIC3 Flash Field Programmable Gate Array (FPGA) A3PE3000L. These tests have been performed in the frame of an European Space Agency (ESA) Technology Research Program (TRP).
Keywords :
application specific integrated circuits; field programmable gate arrays; radiation effects; field programmable gate array; microsemi ProASIC3 flash FPGA family; radiation characterization; single event effects; total ionizing dose; Clocks; Degradation; Flip-flops; Inverters; Phase locked loops; Radiation effects; Random access memory;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062510
