• DocumentCode
    2083299
  • Title

    A general framework for modeling equipment aging

  • Author

    Nachlas, Joel A. ; Cassady, C. Richard

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Virginia Tech, Blacksburg, VA, USA
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    For many types of devices and systems, age is not well described by duration of ownership. The most obvious example of the distinction between age and clock time occurs when a device may be turned off or is not used continuously. More interesting cases are those in which age is accumulated at a variable rate as a consequence of the operational profile the device experiences. In this paper, we develop a general model that permits the analyst to portray three specific features of equipment use in the calculation of age accumulation. The three features are (1) variation in intensity of use, (2) variation in ambient operating conditions and (3) changes in device technology associated with different vintages of the equipment. The general model allows for any or all of these aspects of aging to be represented. Several analytical examples are constructed and analyzed. The analysis shows that the model provides greater sensitivity to operating profiles than previously used aging models and also that those previous models can be obtained as special cases of the model developed here. Thus, previous models are approximations for the model defined here. It is shown that an important implication of the more precise computation of equipment age is the ability to construct more effective preventive maintenance plans.
  • Keywords
    preventive maintenance; production equipment; wear; device technology; equipment aging modeling; preventive maintenance plans; Aging; Automobile manufacture; Chemicals; Clocks; Humidity; Mathematical model; Preventive maintenance; Roads; Solvents; Temperature; ambient conditions; equivalent age; intensity of use; mathematical modeling; vintage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5447987
  • Filename
    5447987