Title :
Total Ionizing Dose Considerations in Space Bound Electronics Subjected to Real Time X-Ray Radioscopic Examinations
Author :
Lawrence, R.K. ; Ocheltree, C.L.
Author_Institution :
BAE Syst., Manassas, VA, USA
Abstract :
Total ionizing dose (TID) dosimetry measurements have been made in a PhoenixTM X-ray Micromex system used for inspection of solder joints and electronic components used in space bound applications.
Keywords :
X-ray effects; dosimetry; inspection; joining processes; nondestructive testing; semiconductor device testing; solders; PhoenixTM X-ray Micromex system; TID dosimetry measurements; electronic components; inspection; real time X-ray radioscopic examinations; solder joints; space bound applications; space bound electronics; total ionizing dose considerations; total ionizing dose dosimetry measurements; Attenuation; Dosimetry; Electron tubes; Inspection; Materials; Photonics; X-ray imaging;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062514
