• DocumentCode
    2083368
  • Title

    LPCVD SiGe for heterojunction bipolar transistors

  • Author

    Parker, G.J. ; Ashburn, P. ; Bonar, J.M ; Gregory, H.J. ; Kennedy, G.P. ; Hamel, J.S.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • fYear
    1995
  • fDate
    34744
  • Firstpage
    42401
  • Lastpage
    42405
  • Abstract
    In this work SiGe Heterojunction Bipolar Transistors (HBTs) are grown using Low-Pressure Chemical Vapour Deposition (LPCVD). To date LPCVD has tended to produce higher quality material for device applications than Molecular Beam Epitaxy (MBE). However, the quality of MBE grown material continues to improve and in the long-term it will be throughput rather than material quality that will become the issue. The LPCVD technique is easily scalable and able to accommodate batches of wafers, MBE is not so easily scalable. Although both techniques are being researched to much the same extent, it remains to be seen which will become the dominant process when this technology comes to market
  • Keywords
    Ge-Si alloys; chemical vapour deposition; heterojunction bipolar transistors; semiconductor growth; semiconductor materials; HBTs; LPCVD; SiGe; SiGe heterojunction bipolar transistors; device applications; growth; low-pressure chemical vapour deposition; material quality; scalability; throughput; wafer batches;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Advanced MOS and Bi-Polar Devices, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19950178
  • Filename
    473099