DocumentCode
2083368
Title
LPCVD SiGe for heterojunction bipolar transistors
Author
Parker, G.J. ; Ashburn, P. ; Bonar, J.M ; Gregory, H.J. ; Kennedy, G.P. ; Hamel, J.S.
Author_Institution
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
fYear
1995
fDate
34744
Firstpage
42401
Lastpage
42405
Abstract
In this work SiGe Heterojunction Bipolar Transistors (HBTs) are grown using Low-Pressure Chemical Vapour Deposition (LPCVD). To date LPCVD has tended to produce higher quality material for device applications than Molecular Beam Epitaxy (MBE). However, the quality of MBE grown material continues to improve and in the long-term it will be throughput rather than material quality that will become the issue. The LPCVD technique is easily scalable and able to accommodate batches of wafers, MBE is not so easily scalable. Although both techniques are being researched to much the same extent, it remains to be seen which will become the dominant process when this technology comes to market
Keywords
Ge-Si alloys; chemical vapour deposition; heterojunction bipolar transistors; semiconductor growth; semiconductor materials; HBTs; LPCVD; SiGe; SiGe heterojunction bipolar transistors; device applications; growth; low-pressure chemical vapour deposition; material quality; scalability; throughput; wafer batches;
fLanguage
English
Publisher
iet
Conference_Titel
Advanced MOS and Bi-Polar Devices, IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19950178
Filename
473099
Link To Document