• DocumentCode
    2083526
  • Title

    Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories

  • Author

    Oldham, Timothy R. ; Berg, Melanie ; Friendlich, Mark ; Wilcox, Ted ; Seidleck, Christina ; LaBel, Kenneth A. ; Irom, Farokh ; Buchner, Steven P. ; McMorrow, Dale ; Mavis, David G. ; Eaton, Paul H. ; Castillo, James

  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    A series of heavy ion and laser irradiations was performed to investigate previously reported current spikes in flash memories. High current events were observed, however, none matches the previously reported spikes. Plausible mechanisms are discussed.
  • Keywords
    flash memories; radiation effects; NAND flash memories; heavy ion irradiation; laser irradiation; spike phenomena; Field programmable gate arrays; Ions; Laser beams; Process control; Radiation effects; Testing; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062522
  • Filename
    6062522
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083526