DocumentCode
2083542
Title
An Iterative Method for the Nonlinear Characterization of the High Tc Superconducing Microstrip Line
Author
Kuo, Chih-Wen ; Itoh, Tatsuo
Author_Institution
Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, U. S. A.
Volume
1
fYear
1991
fDate
9-12 Sept. 1991
Firstpage
655
Lastpage
660
Abstract
Value of surface resistance of the high critical temperature (Tc) superconducting thin film depends upon the power level on the film surface. Analysis of this kind of superconducting thin film microstrip line is a nonlinear problem. An iterative method combining the spectral domain approach and the impedance boundary condition model is applied to solve for the transmission characteristics of the high Tc superconducting microstrip line.
Keywords
Boundary conditions; Current density; High temperature superconductors; Iterative methods; Microstrip; Strips; Superconducting films; Superconducting thin films; Surface impedance; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1991. 21st European
Conference_Location
Stuttgart, Germany
Type
conf
DOI
10.1109/EUMA.1991.336376
Filename
4136360
Link To Document