DocumentCode :
2083542
Title :
An Iterative Method for the Nonlinear Characterization of the High Tc Superconducing Microstrip Line
Author :
Kuo, Chih-Wen ; Itoh, Tatsuo
Author_Institution :
Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, U. S. A.
Volume :
1
fYear :
1991
fDate :
9-12 Sept. 1991
Firstpage :
655
Lastpage :
660
Abstract :
Value of surface resistance of the high critical temperature (Tc) superconducting thin film depends upon the power level on the film surface. Analysis of this kind of superconducting thin film microstrip line is a nonlinear problem. An iterative method combining the spectral domain approach and the impedance boundary condition model is applied to solve for the transmission characteristics of the high Tc superconducting microstrip line.
Keywords :
Boundary conditions; Current density; High temperature superconductors; Iterative methods; Microstrip; Strips; Superconducting films; Superconducting thin films; Surface impedance; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1991. 21st European
Conference_Location :
Stuttgart, Germany
Type :
conf
DOI :
10.1109/EUMA.1991.336376
Filename :
4136360
Link To Document :
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