Title :
Radiation and Reliability Characterization of a Multiplexer Family Using a 0.35µm Triple-Well CMOS Technology
Author :
Wilson, A. ; Kerwin, D. ; Richardson, T. ; Ton, Q. ; Merkel, K. ; Koziuk, G. ; Hafer, C.
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO, USA
Abstract :
A 16:1 analog multiplexer has been designed, manufactured, and characterized for radiation effects and lifetime operation. The device is SEL immune, hardened to 300 krad(Si) TID, and SEU immune up to 62.3 MeV-cm-2/mg. The TID, SEE and lifetime operation performance is reported.
Keywords :
CMOS integrated circuits; multiplexing equipment; radiation effects; reliability; analog multiplexer; lifetime operation performance; radiation effects; reliability; size 0.35 mum; triple-well CMOS technology; Logic gates; MOS devices; Multiplexing; Single event upset; Springs; Testing; Xenon;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062537
