• DocumentCode
    2083901
  • Title

    Material compatibility and dielectric properties of co-fired high and low dielectric constant ceramic packages

  • Author

    Natarajan, Raghu ; Dougherty, J.P.

  • Author_Institution
    Center for Dielectr. Studies, Pennsylvania State Univ., University Park, PA, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    750
  • Lastpage
    754
  • Abstract
    Recent trend in integrated ceramics is to have a 3-dimensional integration of passive components onto the low permittivity dielectric substrate to achieve a monolithic multilayer ceramic (MMC) substrate. MMC substrates offer significant gain in both circuit density and device hermiticity leading to increased reliability and low cost packages. Low-temperature glass-ceramic based low K tapes have been demonstrated to have good compatibility with silver metallization and resistor inks. To push the level of passive component integration one step forward, we studied the materials compatibility and co-firing aspects of low K tapes with high dielectric constant Pb-based relaxer materials. Li salt addition to high K ceramic tape was found to be effective in reducing the sintering temperature to match with that of low K tape. It also improved the dielectric properties and, most importantly, gave a wider processing window for the high K material. This paper describes the optimization of the high K tape casting process such as slurry preparation, rheology, solid content, tape release, lamination, and shrinkage matching with the low-K substrate. This paper also demonstrates the successful integration of high and low K materials
  • Keywords
    casting; ceramics; integrated circuit packaging; integrated circuit reliability; laminates; permittivity; seals (stoppers); sintering; casting process; ceramic packages; circuit density; device hermiticity; dielectric constant; dielectric properties; lamination; low K tapes; low cost packages; low permittivity dielectric substrate; material compatibility; monolithic multilayer ceramic substrate; passive component integration; processing window; reliability; rheology; shrinkage matching; sintering temperature; slurry preparation; solid content; tape release; three-dimensional integration; Ceramics; Costs; Dielectric materials; Dielectric substrates; High K dielectric materials; High-K gate dielectrics; Integrated circuit reliability; Nonhomogeneous media; Packaging; Permittivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606254
  • Filename
    606254