• DocumentCode
    2083912
  • Title

    Field failure rate may not be what you think

  • Author

    McLinn, James A. ; Rand, Daniel

  • Author_Institution
    Rel-Tech Group, Hanover, MN, USA
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Ramp up, commercialization or roll-out are all common terms for one stage of a project when it goes from a low level production rate to a high rate. During this time, it is common for new problems to arise and the time to failure remain unknown. When shipping systems without operating time clocks or serialization, only the quantities shipped and quantities replaced are known. Weibull modeling generated from such roll-out data can easily be misleading. This paper will show some common errors with these model attempts that can be avoided. The roll-out process itself is part of the problem. Often, this is a hurried phase of limited time that is followed by a longer and fairly steady production rate. Even when ramping with a constant failure rate situation, it takes more than six months for the Weibull model data to settle down and look constant. Add a second failure mode, one that occurs in addition to the constant failure rate and the result is a complex Weibull curve that doesn´t reflect either mode well. This easily happens when the operating environment varies from customer to customer. Several examples will make this graphically clear. Lastly, some conclusions are presented and some suggestions that will help separate failure modes during the ramp up. These suggestions will help obtain better estimates for planning warranty costs and determining repair support necessary. The problem described is real; examples from the disk drive industry are cited where ramp up and multiple failure modes are intertwined.
  • Keywords
    failure analysis; hazards; planning; constant failure rate situation; field failure rate; hazard rate; planning warranty costs; roll-out process; shipping systems; Clocks; Commercialization; Costs; Data analysis; Disk drives; Hazards; Production; Virtual manufacturing; Warranties; failure rate; field data; field failures; hazard rate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5448011
  • Filename
    5448011