• DocumentCode
    2084150
  • Title

    The influence of instantaneous value and dv/dt of applied voltage upon electrical treeing deterioration

  • Author

    Osawa, K. ; Urano, K. ; Ehara, Y. ; Kishida, H. ; Ito, T.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Musashi Inst. of Technol., Tokyo, Japan
  • Volume
    1
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    321
  • Abstract
    In this study, we performed to analyze the treeing phenomena with a void by discharge magnitude and discharge luminous quantity in each phase angle area. The purpose of this study was to apply this analysis to the diagnosis of degradation by electrical treeing. The discharge magnitude and discharge luminous image were measured by the original measurement system to analyze discharge pulses and discharge luminescence at several phase angle areas of applied voltage. One cycle of applied voltage was divided into twenty areas, which were named φ 1~φ 20 in order from the negative peak point of applied ac voltage. Each phase angle area has informations of applied voltage that are instantaneous value, differential value of applied voltage (dv/dt) and the product of instantaneous value and dv/dt. The results of this analysis indicate that instantaneous value and dv/dt of applied voltage have a close relation with electrical treeing phenomena. Hence, we investigated the influence of instantaneous value and dv/dt of applied voltage upon electrical treeing phenomena
  • Keywords
    partial discharges; trees (electrical); voids (solid); applied voltage; degradation diagnosis; discharge luminous image; discharge magnitude; discharge pulse; electrical treeing; instantaneous value; phase angle; void; voltage time derivative; Area measurement; Dielectrics and electrical insulation; Luminescence; Needles; Paints; Pulse measurements; Silver; Testing; Trees - insulation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-3851-0
  • Type

    conf

  • DOI
    10.1109/CEIDP.1997.634623
  • Filename
    634623