• DocumentCode
    2084208
  • Title

    Optimization of shrinkage and expansion properties of epoxy encapsulants

  • Author

    Bolger, Justin C.

  • Author_Institution
    Bolger Corp., Needham, MA, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    842
  • Lastpage
    849
  • Abstract
    New resin and filler types now allow epoxy encapsulants to have higher filler loadings and lower expansion coefficients. Reducing encapsulant shrinkage in a wire bonded plastic package has the advantages of lower die stress and less warpage, but if shrinkage is too low, early corrosion failure may occur during humidity tests. To explain why, it has been proposed (1) that compression forces, due to encapsulant shrinkage, can prevent the water which is needed for corrosion from accumulating at the bond pad surface. The objective of this paper is to quantify this corrosion mechanism. The Nernst equation plus heat of adsorption data are used to predict that the minimum compression stress, normal to the bond pads, which is needed to prevent water accumulation and corrosion, should be at least 20 times the partial pressure of water vapor at the test temperature. For example, at 121°C/30 psia, the compression stress from the encapsulant should be at least 600 psi. Shrinkage and expansion data, measured for 5 epoxy encapsulants and 7 epoxy and polyimide die attach adhesives, were used to calculate die stress for each adhesive-encapsulant combination. All 12 materials had low ionic extractables (C1-<20 ppm) but major differences had been found in failure times in pressure cooker tests. The corrosion results correlate with the calculated Z-axis stresses and support the prediction that the minimum stress should be ⩾20 Pw. Die surface stresses depend on the adhesive, adhesive thickness, adhesive cure and die size as well as on the encapsulant
  • Keywords
    adhesion; corrosion testing; encapsulation; failure analysis; humidity; integrated circuit packaging; internal stresses; materials testing; mechanical properties; plastic packaging; polymers; shrinkage; thermal expansion; Nernst equation; adhesive cure; adhesive thickness; compression forces; corrosion failure; corrosion mechanism; die attach adhesives; die stress; epoxy encapsulants; expansion coefficients; expansion properties; failure times; filler loadings; heat of adsorption data; humidity tests; shrinkage properties; warpage; water accumulation prevention; wire bonded plastic package; Bonding forces; Corrosion; Equations; Humidity; Plastic packaging; Resins; Stress; Testing; Water heating; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606268
  • Filename
    606268