• DocumentCode
    2084259
  • Title

    Application of the RIDF´s to the Evaluation of Monopulse Errors Under Saturating ECM Enviroments

  • Author

    Burgos, M. ; Pèrez, F. ; Izquierdo, J. ; Rodríguez, A.

  • Volume
    1
  • fYear
    1991
  • fDate
    9-12 Sept. 1991
  • Firstpage
    793
  • Lastpage
    798
  • Abstract
    It is usually supposed that monopulse systems are immune to noise- jamming ECM´s because of its internal ellimination of external amplitude and phase modulations. In the paper is proved that this is not true under saturating conditions and an analysis scheme based on the RIDF´s (Random Input Describing Functions) is proposed. The main advantage of this method is its numeric efficiency which allows subsystem´s saturation behaviour be included in dynamic simulators.
  • Keywords
    Active noise reduction; Electrochemical machining; Gaussian noise; Jamming; Narrowband; Noise level; Phase modulation; Phase noise; Sampling methods; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1991. 21st European
  • Conference_Location
    Stuttgart, Germany
  • Type

    conf

  • DOI
    10.1109/EUMA.1991.336399
  • Filename
    4136383
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2084259