• DocumentCode
    2084363
  • Title

    A low insertion loss, high linearity, T/R switch in 65 nm bulk CMOS for WLAN 802.11g applications

  • Author

    Han, Yiping ; Carter, Keith ; Larson, Lawrence E. ; Behzad, Arya

  • Author_Institution
    Univ. of California, San Diego, La Jolla, CA
  • fYear
    2008
  • fDate
    June 17 2008-April 17 2008
  • Firstpage
    681
  • Lastpage
    684
  • Abstract
    A transmit-receiver (T/R) switch is fabricated in a 65 nm CMOS process for WLAN 802.11 g applications. By floating the triple well device, the switch achieves low insertion loss, high power handling capability and good linearity simultaneously. In the transmit mode, the switch features 0.8 dB insertion loss, 29 dBm output P1dB and less than 0.2 dB EVM degradation at 24 dBm output power level. In the receive mode, it exhibits 1.6 dB insertion loss and 28 dB isolation at 2.45 GHz.
  • Keywords
    CMOS integrated circuits; UHF integrated circuits; transceivers; wireless LAN; T/R switch; WLAN IEEE 802.11g; bulk CMOS; frequency 2.45 GHz; high linearity; low insertion loss; size 65 nm; transmit-receiver switch; CMOS process; Diodes; Impedance; Inductors; Insertion loss; Linearity; Propagation losses; Switches; Voltage; Wireless LAN; 802.11; CMOS; EVM; T/R switches; WLAN; triple-well device;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-1808-4
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2008.4561529
  • Filename
    4561529