Title :
Revision of MIL-HDBK-217, Reliability Prediction of Electronic Equipment
Author :
Harms, Jeffrey W.
Author_Institution :
Crane Div., Naval Surface Warfare Center, Crane, IN, USA
Abstract :
This paper will discuss current efforts in the revision of MIL-HDBK-217, Military Handbook, Reliability Prediction of Electronic Equipment. It has been over a decade since this reliability prediction handbook was last updated, yet it remains the most widely used reliability prediction method for electronic equipment. In February 2008, the Defense Standardization Program Office (DSPO) tasked the Crane Division, Naval Surface Warfare Center (NSWC Crane), as the Preparing Activity, to revise MIL-HDBK-217. A plan has been created to refresh the handbook and to look at adding a new approach to better reflect reliability of electronic equipment. A working group of individuals representing Department of Defense (DoD) and industry has been established to conduct this revision. Development and implementation of solutions that reflect industry best practices and DoD needs is critical for success. Results of this task are planned to be new revisions of MIL-HDBK-217. These revisions will provide an updated reliability prediction tool that will assist reliability engineers in performing their work.
Keywords :
defence industry; electronic equipment testing; military equipment; reliability; Crane Division; Defense Standardization Program Office; Department of Defense; MIL-HDBK-217; NSWC Crane; Naval Surface Warfare Center; electronic equipment; military handbook; reliability engineers; reliability prediction handbook; reliability prediction tool; Best practices; Cranes; Defense industry; Electronic equipment; Electronic warfare; Military equipment; Phase estimation; Prediction methods; Reliability engineering; Standardization; prediction; reliability;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
DOI :
10.1109/RAMS.2010.5448046