DocumentCode
2084634
Title
Analysis of measurement error caused by instability of reference voltage
Author
Smerdov, A. ; Gritcuyk, O.
Author_Institution
Lviv Polytech. Nat. Univ., Ukraine
fYear
2001
fDate
12-17 Feb. 2001
Firstpage
111
Abstract
Summary form only given. In the process of measuring the product of capacity and resistance through time intervals, measurement error arises caused by the reference voltage instability of the comparators. This measurement error must be evaluated and taken into account for correct analysis of the measured parameters. In this paper the measurement error caused by reference voltage instability of comparators is given.
Keywords
capacitance measurement; electric potential; electric resistance measurement; measurement errors; stability; capacity measurement; comparators; measurement error; reference voltage instability; resistance measurement; time intervals; Electrical resistance measurement; Equations; Error analysis; Error correction; Fluctuations; Measurement errors; Time measurement; Tin; Voltage; White noise;
fLanguage
English
Publisher
ieee
Conference_Titel
CAD Systems in Microelectronics, 2001. CADSM 2001. Proceedings of the 6th International Conference. The Experience of Designing and Application of
Conference_Location
Lviv-Slavsko, Ukraine
Print_ISBN
966-553-079-8
Type
conf
DOI
10.1109/CADSM.2001.975767
Filename
975767
Link To Document