Title :
Fundamental theory of simulation of influencing of internal mechanical pressure on parameters of integral devices
Author :
Matvijkiv, Mychajlo ; Ivasyk, Yurij
Author_Institution :
Radio Eng. Fac., Nat. Univ. Lviv Polytech., Ukraine
Abstract :
A method of quantitative assessment of the influence of internal mechanical pressure on the parameters of integral devices is offered on the basis of the available data about the influence of pressure on parameters of the components of the integral device.
Keywords :
analogue integrated circuits; circuit simulation; hybrid integrated circuits; integrated circuit modelling; integrated circuit reliability; internal stresses; stress analysis; analogue ID; hybrid module; integral device component parameters; integral device parameters; integral devices; internal mechanical pressure; linear ID; parametric reliability; quantitative assessment; simulation; Analog computers; Circuits; Finite element methods; Gold; Random variables; Stability; Temperature;
Conference_Titel :
CAD Systems in Microelectronics, 2001. CADSM 2001. Proceedings of the 6th International Conference. The Experience of Designing and Application of
Conference_Location :
Lviv-Slavsko, Ukraine
Print_ISBN :
966-553-079-8
DOI :
10.1109/CADSM.2001.975786
