A New Approach of the Source Method for Characterization of Planar Structures

An analysis of planar circuits using the source method is presented. The definition of the input impedance seen from the source shows the arbitrary nature of the current source. An homographical relation, which relates the computed values to the true values of the input impedance, is demonstrated. Coupling two-port networks are introduced between the source and the access line of the circuit. The scattering parameters of a microstrip step discontinuity are given as an example.