• DocumentCode
    2085562
  • Title

    Failure diagnosis of discrete event systems with linear-time temporal logic fault specifications

  • Author

    Jiang, Shengbing ; Kumar, Ratnesh

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Kentucky Univ., Lexington, KY, USA
  • Volume
    1
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    128
  • Abstract
    The failure diagnosis problem of discrete event systems with linear-time temporal logic specifications is studied. Diagnosability of discrete event systems in the temporal logic setting is defined. The problem of testing diagnosability is reduced to the problem of model checking. An algorithm for the test of diagnosability and the synthesis of a diagnoser is obtained.
  • Keywords
    computational complexity; discrete event systems; fault diagnosis; formal verification; temporal logic; diagnosability; discrete event systems; failure diagnosis; linear-time temporal logic fault specifications; model checking; Computer science; Condition monitoring; Control system synthesis; Discrete event systems; Fault diagnosis; Formal languages; Logic testing; Natural languages; Reliability engineering; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2002. Proceedings of the 2002
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-7298-0
  • Type

    conf

  • DOI
    10.1109/ACC.2002.1024792
  • Filename
    1024792