Title :
How stimulation speed affects Event-Related Potentials and BCI performance
Author :
Hohne, J. ; Tangermann, M.
Author_Institution :
Machine Learning Dept., Berlin Inst. of Technol., Berlin, Germany
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
In most paradigms for Brain-Computer Interfaces (BCIs) that are based on Event-Related Potentials (ERPs), stimuli are presented with a pre-defined and constant speed. In order to boost BCI performance by optimizing the parameters of stimulation, this offline study investigates the impact of the stimulus onset asynchrony (SOA) on ERPs and the resulting classification accuracy. The SOA is defined as the time between the onsets of two consecutive stimuli, which represents a measure for stimulation speed. A simple auditory oddball paradigm was tested in 14 SOA conditions with a SOA between 50 ms and 1000 ms. Based on an offline ERP analysis, the BCI performance (quantified by the Information Transfer Rate, ITR in bits/min) was simulated. A great variability in the simulated BCI performance was observed within subjects (N=11). This indicates a potential increase in BCI performance (≥ 1.6 bits/min) for ERP-based paradigms, if the stimulation speed is specified for each user individually.
Keywords :
auditory evoked potentials; biomedical measurement; brain-computer interfaces; electroencephalography; medical signal processing; signal classification; BCI paradigms; BCI performance; ERP; SOA; auditory oddball paradigm; brain-computer interfaces; classification accuracy; consecutive stimuli onsets; event related potentials; information transfer rate; stimulation parameter optimisation; stimulation speed; stimulus onset asynchrony; time 50 ms to 1000 ms; Accuracy; Brain computer interfaces; Electrodes; Electroencephalography; Image color analysis; Semiconductor optical amplifiers; Visualization; Acoustic Stimulation; Area Under Curve; Brain-Computer Interfaces; Electrodes; Evoked Potentials; Humans;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6346300