Title :
Sensitivity based testing of nonlinear circuits
Author :
Starzyk, Janusz A. ; Dai, Hong
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio Univ., Athens, OH, USA
Abstract :
The authors present a sensitivity-based method to test nonlinear circuits with small variations of element parameters. Several excitation levels and signal frequencies are used to improve system testability. This method is illustrated using piecewise-linear models, although it can be generalized to handle other nonlinear characteristics. The QR algorithm is used to select test points and ensure numerical stability. In the case of a sufficient number of measurement points, a linear, fault verification technique can also be used.<>
Keywords :
fault location; nonlinear network analysis; piecewise-linear techniques; sensitivity analysis; testing; QR algorithm; fault verification technique; nonlinear circuits; numerical stability; piecewise-linear models; sensitivity-based method; system testability; testing; Admittance; Circuit testing; Difference equations; Fault diagnosis; Nonlinear circuits; Nonlinear equations; Piecewise linear techniques; Q measurement; Signal analysis; Voltage measurement;
Conference_Titel :
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location :
Espoo, Finland
DOI :
10.1109/ISCAS.1988.15132
