DocumentCode :
2086794
Title :
Computing the k-error 2-adic complexity of 2n-periodic sequence based on genetic algorithm
Author :
Niu, Zhihua ; Li, Zheng
Author_Institution :
Sch. of Comput. Eng. & Sci., Shanghai Univ., Shanghai, China
fYear :
2010
fDate :
17-19 Dec. 2010
Firstpage :
182
Lastpage :
185
Abstract :
Sequences generated by feedback with carry shift registers (FCSR) have been extensively concerned for their as excellent randomness as the sequences generated by linear feedback shift registers (LFSR). 2-adic complexity is of fundamental importance as measure index on the security of cryptographic sequence. A good random sequence should not only have a high 2-adic complexity but also a few bit changed can not cause a significant decrease of the 2-adic complexity. This requirement leads to the concept of k-error 2-adic complexity. However it is a difficult problem to compute the k-error 2-adic complexity based on the traditional method in algebraic analysis. Considering that it is an optimization problem and the genetic algorithm is good at solving these problems, we investigate the genetic algorithm to compute the k-error 2-adic complexity of 2n-periodic sequences. The experiments show that we can get the approximate values very close to the exact value.
Keywords :
algebra; computational complexity; cryptography; genetic algorithms; 2n-periodic sequences; algebraic analysis; cryptographic sequence; feedback with carry shift registers; genetic algorithm; high 2-adic complexity; k-error 2-adic complexity; linear feedback shift registers; measure index; optimization problem; random sequence; Algorithm design and analysis; Approximation methods; Binary sequences; Complexity theory; Cryptography; Gallium; Shift registers; 2-adic complexity; cryptographic sequence; feedback with carry shift registers (FCSR); genetic algorithm; k-error 2-adic complexity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory and Information Security (ICITIS), 2010 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6942-0
Type :
conf
DOI :
10.1109/ICITIS.2010.5688755
Filename :
5688755
Link To Document :
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