Title : 
Electrodeposition of Au-Sn alloys for lead-free solders: Au-rich eutectic and Sn-rich eutectic compositions
         
        
            Author : 
He, Anping ; Ivey, D.G.
         
        
            Author_Institution : 
Dept. of Chem. & Mater. Eng., Univ. of Alberta, Edmonton, AB, Canada
         
        
        
            fDate : 
Feb. 27 2013-March 1 2013
         
        
        
        
            Abstract : 
The Au-Sn binary phase diagram shows that there are two eutectic alloy compositions. The first one is at ~30 at% Sn (Au-rich) with a melting point of 280°C and the second composition is at ~94 at% Sn (Sn-rich) with an eutectic temperature at 217°C. This paper summarizes work that demonstrates that both eutectic alloys can be electrodeposited from electrolytes that are non-toxic and environmentally friendly. The Au-rich eutectic alloy is electrodeposited as alternating layers of Au5Sn and AuSn, while the Sn-rich eutectic alloy is electrodeposited as sequential Au5Sn and Sn layers. In both cases, the entire electrodeposition process is achieved using a single solution, for each eutectic composition, without exposing the sample to air during electrodeposition. Each phase composition is attained by varying the current density only. The microstructure of as-deposited and reflowed solders is characterized and confirmed using X-ray diffraction and scanning electron microscopy.
         
        
            Keywords : 
X-ray diffraction; electrodeposition; electrolytes; eutectic alloys; gold alloys; scanning electron microscopy; solders; tin alloys; Au-Sn; X-ray diffraction; binary phase diagram; environmentally friendly electrolytes; eutectic alloy composition; eutectic alloy electrodeposition; eutectic composition; eutectic temperature; lead-free solder; nontoxic electrolytes; scanning electron microscopy; single solution; temperature 217 C; Abstracts; Chemicals; Gold; Lead; Tin;
         
        
        
        
            Conference_Titel : 
Advanced Packaging Materials (APM), 2013 IEEE International Symposium on
         
        
            Conference_Location : 
Irvine, CA
         
        
        
            Print_ISBN : 
978-1-4673-6093-7
         
        
            Electronic_ISBN : 
1550-5723
         
        
        
            DOI : 
10.1109/ISAPM.2013.6510388