• DocumentCode
    2086996
  • Title

    A study of solder alloy ductility for cryogenic applications

  • Author

    Lupinacci, A. ; Shapiro, A.A. ; Suh, J.O. ; Minor, A.M.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Univ. of California, Berkeley, Berkeley, CA, USA
  • fYear
    2013
  • fDate
    Feb. 27 2013-March 1 2013
  • Firstpage
    82
  • Lastpage
    88
  • Abstract
    For aerospace applications it is important to understand the mechanical performance of components at the extreme temperature conditions seen in service. For solder alloys used in microelectronics, cryogenic temperatures can prove problematic. At low temperatures Sn-based solders undergo a ductile to brittle transition that leads to brittle cracks, which can result in catastrophic failure of electronic components, assemblies and spacecraft payloads. As industrial processes begin to move away from Pb-Sn solder, it is even more critical to characterize the behavior of alternative Sn-based solders. Here we report on initial investigations using a modified Charpy test apparatus to characterize the ductile to brittle transformation temperature of nine different solder systems.
  • Keywords
    assembling; brittleness; cryogenic electronics; ductility; lead alloys; solders; tin alloys; Charpy test apparatus; aerospace applications; assembly; brittle cracks; catastrophic failure; cryogenic applications; ductile to brittle transformation temperature; ductile to brittle transition; electronic components; extreme temperature conditions; industrial processes; low temperatures tin-based solders; mechanical performance; microelectronics; solder alloy ductility; solder systems; spacecraft payloads; Abstracts; Antenna accessories; Batteries; Metals; Nitrogen; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials (APM), 2013 IEEE International Symposium on
  • Conference_Location
    Irvine, CA
  • ISSN
    1550-5723
  • Print_ISBN
    978-1-4673-6093-7
  • Electronic_ISBN
    1550-5723
  • Type

    conf

  • DOI
    10.1109/ISAPM.2013.6510390
  • Filename
    6510390