DocumentCode
2086996
Title
A study of solder alloy ductility for cryogenic applications
Author
Lupinacci, A. ; Shapiro, A.A. ; Suh, J.O. ; Minor, A.M.
Author_Institution
Dept. of Mater. Sci. & Eng., Univ. of California, Berkeley, Berkeley, CA, USA
fYear
2013
fDate
Feb. 27 2013-March 1 2013
Firstpage
82
Lastpage
88
Abstract
For aerospace applications it is important to understand the mechanical performance of components at the extreme temperature conditions seen in service. For solder alloys used in microelectronics, cryogenic temperatures can prove problematic. At low temperatures Sn-based solders undergo a ductile to brittle transition that leads to brittle cracks, which can result in catastrophic failure of electronic components, assemblies and spacecraft payloads. As industrial processes begin to move away from Pb-Sn solder, it is even more critical to characterize the behavior of alternative Sn-based solders. Here we report on initial investigations using a modified Charpy test apparatus to characterize the ductile to brittle transformation temperature of nine different solder systems.
Keywords
assembling; brittleness; cryogenic electronics; ductility; lead alloys; solders; tin alloys; Charpy test apparatus; aerospace applications; assembly; brittle cracks; catastrophic failure; cryogenic applications; ductile to brittle transformation temperature; ductile to brittle transition; electronic components; extreme temperature conditions; industrial processes; low temperatures tin-based solders; mechanical performance; microelectronics; solder alloy ductility; solder systems; spacecraft payloads; Abstracts; Antenna accessories; Batteries; Metals; Nitrogen; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials (APM), 2013 IEEE International Symposium on
Conference_Location
Irvine, CA
ISSN
1550-5723
Print_ISBN
978-1-4673-6093-7
Electronic_ISBN
1550-5723
Type
conf
DOI
10.1109/ISAPM.2013.6510390
Filename
6510390
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