• DocumentCode
    2087057
  • Title

    Au and Pd embrittlement in space-confined soldering reactions for 3D IC applications

  • Author

    Chen, Y.J. ; Huang, K.Y. ; Chen, Huan Ting ; Kao, C.R.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2013
  • fDate
    Feb. 27 2013-March 1 2013
  • Firstpage
    102
  • Lastpage
    112
  • Abstract
    Soldering reactions under space confinement has become increasingly important due to its application for chip stacking in three-dimensional integrated circuits (3D ICs. This study reports the effects of Au, from the dissolution of surface finishes, in such space-confined solder joints. Our results indicate that (Au,Ni)Sn4 can form a continuous layer across the entire of the joint, even when Au is very thin. This morphology is detrimental to the joint reliability. In other words, the so-called gold embrittlement has becomes relevant in 3D IC packaging. Pd is one of the most commonly used materials for surface finishes. The effects of Pd will also be discussed. In addition, solutions to solve the Au and Pd embrittlement are presented in this work.
  • Keywords
    gold; integrated circuit reliability; palladium; soldering; surface finishing; three-dimensional integrated circuits; 3D integtated circuits; Au; Pd; chip stacking; gold embrittlement; joint reliability; palladium embrittlement; soldering reactions; space confinement; surface finishes; Abstracts; Compounds; Gold; Intermetallic; Joints; Nickel; Tin; 3D IC; Au embrittlement; ENEPIG; ENIG; Pd embrittlement; intermetallic compound; micro-joints; microstructure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials (APM), 2013 IEEE International Symposium on
  • Conference_Location
    Irvine, CA
  • ISSN
    1550-5723
  • Print_ISBN
    978-1-4673-6093-7
  • Electronic_ISBN
    1550-5723
  • Type

    conf

  • DOI
    10.1109/ISAPM.2013.6510393
  • Filename
    6510393