Analog-to-digital converter error diagnosis

Author

Irons, F.H. ; Hummels, D.M. ; Papantonopoulos, I.N. ; Zoldi, C.A.

Author_Institution

Maine Univ., Orono, ME, USA

Volume

1

fYear

1996

fDate

1996

Firstpage

732

Abstract

Following published procedures for characterizing ADCs using phase-plane error functions, this paper shows how a given calibration data set may used to extract estimates of: specific error performance features pertaining to ADC architectural considerations. The procedure requires the selection of basic functions based upon properties of a desired feature. The techniques are applied to the 8-bit TKAD20 operating at 204.8 MSPS to illustrate the concepts discussed in the paper. Results show how it is possible to estimate hysteresis and average sample time errors versus the state of the ADC. A simple consideration shows why it is not possible to separate sample time errors from the effects of nonlinear capacitance and a first ever diagnosis yields sample-time jitter versus ADC state

Keywords

analogue-digital conversion; calibration; error analysis; hysteresis; jitter; 204.8 MSPS; 8-bit TKAD20; ADC error; analog-to-digital converter; average sample time errors; calibration; error diagnosis; error performance; estimates; hysteresis; nonlinear capacitance; phase-plane error functions; sample time errors; sample-time jitter; Analog-digital conversion; Calibration; Circuit testing; Computer errors; Data mining; Delta modulation; Hysteresis; Iron; Quantization; State estimation;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507478

Filename

507478