DocumentCode :
20876
Title :
Tunnel-Junction-Limited Multijunction Solar Cell Performance Over Concentration
Author :
Walker, Alexandre W. ; Theriault, Olivier ; Wilkins, Matthew M. ; Wheeldon, Jeffrey F. ; Hinzer, Karin
Author_Institution :
Univ. of Ottawa, Ottawa, ON, Canada
Volume :
19
Issue :
5
fYear :
2013
fDate :
Sept.-Oct. 2013
Firstpage :
1
Lastpage :
8
Abstract :
The simulation of tunnel junctions is performed by using nonlocal band-to-band and trap assisted tunneling models that are capable of reproducing the experimental current-voltage characteristics of p++AlGaAs/ n++AlGaAs and p++AlGaAs/ n++GaAs based devices. These simulated characteristics are then implemented within a lattice matched InGaP/(In)GaAs/Ge multijunction solar cell (MJSC) to assess the performance as a function of tunnel junction layer doping in the regime where the TJ limits the performance of the MJSC. At 500 suns, a 4.6% absolute drop in simulated efficiency is observed for an AlGaAs/GaAs bottom TJ corresponding to a degenerately p-doped layer of 2.5 × 1019 cm-3 compared to a TJ with a doping of 4×1020 cm-3. A minimum p++ doping level of 3.3 × 10 19 cm-3 is required in order to avoid bottom TJ limitation up to 1000 suns concentration for an n++ doping of 2 × 1019 cm-3 based on the calibrated models. Furthermore, the effects of the peak and valley current densities are shown to have a strong influence on the efficiency over concentration within the TJ limiting regime.
Keywords :
III-V semiconductors; aluminium compounds; calibration; current density; gallium arsenide; germanium; indium compounds; semiconductor device models; semiconductor doping; solar cells; tunnelling; AlGaAs-GaAs; InGaP-InGaAs-Ge; MJSC; TJ limitation; current densities; lattice matching; nonlocal band-to-band tunneling models; trap assisted tunneling models; tunnel-junction-limited multijunction solar cell; Tunnel junctions; concentrated photovoltaics; modeling and simulation; multijunction solar cells;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2013.2258140
Filename :
6502186
Link To Document :
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