DocumentCode :
2087752
Title :
Coupled finite element analysis of super heat resistant ceramic insulated wire
Author :
Grise, WilliamR ; Zargari, Ahmad
Author_Institution :
Dept. of IET, Morehead State Univ., Morehead, KY, USA
fYear :
1997
fDate :
22-25 Sep 1997
Firstpage :
219
Lastpage :
227
Abstract :
A coupled finite element analysis is used to understand the role of high ambient temperatures in promoting the growth of fatigue cracks in the various layers of super heat resistant ceramic insulated wire. Comparisons are made among three types of composite conductors. In all three, the core conductor material is copper. A second layer, moving outward from the center, uses either niobium or tantalum. The final portion of the composite conductor is formed of either nickel or titanium. These outer layers of the conducting portion of the wire are necessary to prevent diffusion of metal atoms from the conductor into the ceramic insulation which surrounds the composite conductor. The ceramic layer is made of alumina. After determining the state of stress and strain in the wire due to a series of high temperatures, cracks of varying initial sizes are placed in the material and a specialized finite element program, FRANC2DL, is used to analyze the path of the crack and the fatigue failure
Keywords :
alumina; ceramic insulation; copper; fatigue cracks; finite element analysis; heat transfer; insulated wires; nickel; niobium; stress analysis; tantalum; titanium; Al2O3; Cu-Nb-Ni; Cu-Nb-Ni wire; Cu-Nb-Ti; Cu-Nb-Ti wire; Cu-Ta-Ni; Cu-Ta-Ni wire; FRANC2DL; alumina; composite conductors; copper core conductor material; coupled finite element analysis; fatigue cracks growth; finite element program; fracture analysis; heat conduction; heat transfer; high temperatures; nickel; niobium; strain; stress; super heat resistant ceramic insulated wire; tantalum; titanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference, 1997, and Electrical Manufacturing & Coil Winding Conference. Proceedings
Conference_Location :
Rosemont, IL
ISSN :
0362-2479
Print_ISBN :
0-7803-3959-2
Type :
conf
DOI :
10.1109/EEIC.1997.651045
Filename :
651045
Link To Document :
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