Characterization, parameter extraction and modeling for high frequency applications

Characterization, parameter extraction and modeling of semiconductor devices are three closely related processes which are critical to the rapid development of microwave circuits. The processes are so closely related that comparisons (between two models, for example) are not valid unless the overall characterization/parameter extraction/modeling strategy is considered as a single unit. This presentation provides an overview of several different strategies that are being applied to the modeling problem within the American scene. These strategies include both conventional and novel approaches. Comparisons between some of the large signal strategies is made by comparing measured circuit performance to simulation predictions. Trends in this field as well as remaining challenges are also discussed.