Title :
Super-low-noise HEMT based on new HEMT noise model
Author :
Joshin, Kazukiyo ; Ohori, Tatsuya ; Takikawa, Masahiko
Author_Institution :
Fujitsu Laboratories Ltd 10-1, Morinosato-Wakamiya, Atsugi 243-01, JAPAN. Tel. +81 462 48 3111; Fax: +81 462 48 3672; e-mail: joshin@flab.fujitsu.co.jp
Abstract :
Using a two-dimensional device simulation, we clarified why HEMT´s have a superior low-noise performance. The new HEMT noise model, which considers the cooling effect on the electron temperature, indicates that higher sheet carrier density leads to lower noise power. Using this noise model, super-low-noise HEMT´s with a 0.15-¿m T-shaped-gate were fabricated on an In0.49Ga0.51p/In0.25Ga0.75As heterostructure. The device achieved an optimum noise figure of 0.42 dB with an associated gain of 13.5 dB at 12 GHz.
Keywords :
Acoustical engineering; Charge carrier density; Cooling; Electrodes; Electrons; Gallium arsenide; HEMTs; MESFETs; Noise figure; Temperature;
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
DOI :
10.1109/EUMA.1993.336801