Title :
A customer-oriented test-estimation test
Author_Institution :
Dept. of Eng., Savannah State Coll., GA, USA
Abstract :
In this paper, a customer-oriented test, estimation test (COTET), is presented, which is an application of estimation theory into compact testing, to speed up error detection with optimized test quality in VLSI circuits. An algorithm is developed for customers to estimate and generate test parameters efficiently in COTET. Finally, the COTET will be evaluated by simulation to prove its efficiency. The results of the simulation will be given in presentation
Keywords :
VLSI; error detection; estimation theory; integrated circuit testing; VLSI circuits; algorithm; customer-oriented test; error detection; estimation test; estimation theory; simulation; test parameters; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Estimation theory; Integrated circuit testing; Logic testing; Sequential circuits; System testing; Very large scale integration;
Conference_Titel :
Southeastcon '94. Creative Technology Transfer - A Global Affair., Proceedings of the 1994 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
0-7803-1797-1
DOI :
10.1109/SECON.1994.324307
