An Extended LLRP Model for RFID System Test and Diagnosis

In recent years, radio frequency identification (RFID) systems have been increasingly used in critical domains such as medical field or real-time processing domains. Although important efforts have been made to make this technology more reliable and fault-tolerant, more research is needed to meet the increasing dependability requirements. In this article, we propose a dependability approach consisting in two steps. The first one is an analysis of RFID systems in order to identify potential failures of RFID middleware components and their effects on the whole system. The second one is the modelling of the communication behaviour of RFID systems (that is represented by Low Level Reader Protocol) as a finite state machine. This protocol FSM will be extended to take into consideration the failures identified in the first step and serves as a diagnosis and test tool for the RFID system.