• DocumentCode
    2088760
  • Title

    Static Reliability Analysis on Pantograph of V500 Type

  • Author

    Song, D.L. ; Zhang, W.H. ; Mei, G.M. ; Wang, J.B.

  • Author_Institution
    State Key Lab. of Traction Power, Southwest Jiaotong Univ., Chengdu, China
  • Volume
    4
  • fYear
    2010
  • fDate
    14-15 Aug. 2010
  • Firstpage
    181
  • Lastpage
    184
  • Abstract
    An efficient reliability analysis mode, reliability analysis mode based on truncated normal distribution, is proposed for calculating the reliability of mechanical structures. The calculation starts from a dynamic load history, the distribution of loads is determined. In the paper, the stress distribution is supposed as truncated normal distribution and its parameters are determined by finite element(FE) method under the selected load system. And the reliability analysis mode based on truncated normal distribution is established as a relation from the stress and strength into the reliability of mechanical structure. Application on the determination of static reliability for the pantograph of V500 type has indicated availability of the present approach. A deficience has been overcome from the negative stress and strength and the reliability has been increased by the current approach.
  • Keywords
    mechanical stability; normal distribution; pantographs; railway rolling stock; reliability; stress analysis; vehicle dynamics; V500 type pantograph; dynamic load history; finite element method; load distribution; mechanical structure reliability; reliability analysis mode; static reliability analysis; stress distribution; truncated normal distribution; Analytical models; Force; Gaussian distribution; History; Reliability engineering; Stress; Pantograph; Railway high-speed train; Reliability analysis; Truncated normal distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Engineering (ICIE), 2010 WASE International Conference on
  • Conference_Location
    Beidaihe, Hebei
  • Print_ISBN
    978-1-4244-7506-3
  • Electronic_ISBN
    978-1-4244-7507-0
  • Type

    conf

  • DOI
    10.1109/ICIE.2010.334
  • Filename
    5572716