Title :
Using Mutants to Locate "Unknown" Faults
Author :
Papadakis, Mike ; Le Traon, Yves
Author_Institution :
Interdiscipl. Center for Security, Reliability & Trust (SnT), Univ. of Luxembourg, Luxembourg City, Luxembourg
Abstract :
Many fault localization techniques operate by crosscutting coverage information of passed and failed test executions. Generally, their accuracy depends on the utilized coverage elements and on the selected test cases. This paper proposes a novel fault localization method using mutation and investigates its accuracy when using classical test selection criteria such as mutation, branch and block. A controlled experiment shows that (1) the mutation based approach is quite effective at identifying "unknown" faulty program statements. Additionally, the experimental results reveal (2) that the mutation-based test suites are significantly more effective at supporting fault localization than block or branch-based test suites. Further, (3) evidence in support of facilitating mutation alternatives, such as mutant sampling, in order to diminish mutation overheads is also given.
Keywords :
program testing; software fault tolerance; block criteria; branch criteria; failed test execution; fault localization technique; faulty program statement; mutant sampling; mutation based approach; mutation criteria; mutation overhead; mutation-based test suite; passed test execution; test selection criteria; unknown fault location; Couplings; Debugging; Educational institutions; Fault diagnosis; Software testing; Syntactics; debugging; fault localization; mutation analysis;
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2012 IEEE Fifth International Conference on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4577-1906-6
DOI :
10.1109/ICST.2012.159