Title :
Fault analysis of the multiple valued logic using spectral method
Author :
Kim, Young Gun ; Lala, Parag ; Young Gun Kim ; Heung Soo Kim
Author_Institution :
Dept. of Electr. Eng., Dongyang Tech. Coll., Seoul, South Korea
Abstract :
A method for detecting faults in Multiple Valued Logic (MVL) is proposed. The method depends on analyzing the spectral coefficients that are transformed for the Chrestenson spectral domain. The fault detecting conditions are derived for a single input stuck-at fault, multiple input s-a-f, a s-a-f at internal lines, and Min/Max bridging fault of the MVL. Fault detection is done based on the number of coefficients affected by a fault, and hence it is independent of the technology used for construction of networks and the types of fault. This method allows detection of the fault without the test vector, and minimize the memory size for storing test vectors and response data
Keywords :
logic testing; multivalued logic; fault detecting; fault detection; multiple valued logic; spectral method; test vectors; Multivalued logic;
Conference_Titel :
Multiple-Valued Logic, 2000. (ISMVL 2000) Proceedings. 30th IEEE International Symposium on
Conference_Location :
Portland, OR
Print_ISBN :
0-7695-0692-5
DOI :
10.1109/ISMVL.2000.848601