Analog statistical simulation

A technique for providing design for manufacturability of analog circuits is presented. This technique consists of novel approaches for the definition and extraction of the physical process parameters and relationship to the electrical simulation parameters, an improved modeling technique based on geometric characteristics, and a statistical simulation technique that provides Cpk and yield analysis. To support these techniques a design tool called MSTAT (Motorola Statistical Analysis Tool) is developed to provide the analog designer with these capabilities. Benefits from these techniques result in the ability of a analog designer to achieve a higher level of quality in the design of a part, by being able to model and simulate a circuit based on the process variational and geometric attributes