Title :
Innovative design-for-test techniques in a dynamic development environment
Author :
Bou-Ghazale, Silvio
Author_Institution :
IBM Corp., Boca Raton, FL, USA
Abstract :
The personal computer industry has experienced unprecedented market pressures in the last few years. These pressures helped reshape the processes by which products are architected, implemented, and manufactured to contain cost, maintain quality, and provide fast time-to-market. This paper presents the design-for-test techniques that are essential in such an environment
Keywords :
DP industry; design for testability; integrated circuit manufacture; specification languages; cost containment; design-for-test techniques; dynamic development environment; market pressures; personal computer industry; product architecture; product implementation; product manufacture; quality; time-to-market; Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Costs; Design for testability; Manufacturing; System testing; Test pattern generators;
Conference_Titel :
Southeastcon '94. Creative Technology Transfer - A Global Affair., Proceedings of the 1994 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
0-7803-1797-1
DOI :
10.1109/SECON.1994.324351
