DocumentCode :
2089619
Title :
Recovery Block with Backup Voting: A New Pattern with Extended Representation for Safety Critical Embedded Systems
Author :
Armoush, Ashraf ; Salewski, Falk ; Kowalewski, Stefan
Author_Institution :
Embedded Software Lab., RWTH Aachen Univ., Aachen, Germany
fYear :
2008
fDate :
17-20 Dec. 2008
Firstpage :
232
Lastpage :
237
Abstract :
The concept of design patterns has been widely used in the software and hardware domain. Several fault tolerance patterns have been proposed to document widely used fault tolerance methods. In this paper, we propose a new software fault tolerance pattern, which is called recovery block with backup voting pattern. This pattern can be used to improve the software reliability of the classical recovery block pattern in applications in which the construction of an effective acceptance test can not be guaranteed. In order to represent the new pattern, we use a pattern representation that focuses on the nonfunctional consequences of the design patterns on safety critical embedded systems. These nonfunctional consequences contain: safety, reliability, modifiability, cost, and execution time. Among other side effects, the implications part of the new pattern shows that it is resulting in higher reliability than the classical recovery block with relatively low additional hardware cost.
Keywords :
embedded systems; object-oriented programming; program testing; safety-critical software; software fault tolerance; system recovery; design pattern; nonfunctional consequence; pattern representation; recovery block backup voting pattern; safety critical embedded system; software fault tolerance; software reliability; Costs; Embedded software; Embedded system; Fault tolerance; Hardware; Software design; Software reliability; Software safety; Testing; Voting; Backup Voting; Design Pattern; Recovery Block; Safety Critical;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology, 2008. ICIT '08. International Conference on
Conference_Location :
Bhubaneswar
Print_ISBN :
978-1-4244-3745-0
Type :
conf
DOI :
10.1109/ICIT.2008.60
Filename :
4731332
Link To Document :
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