• DocumentCode
    2089619
  • Title

    Recovery Block with Backup Voting: A New Pattern with Extended Representation for Safety Critical Embedded Systems

  • Author

    Armoush, Ashraf ; Salewski, Falk ; Kowalewski, Stefan

  • Author_Institution
    Embedded Software Lab., RWTH Aachen Univ., Aachen, Germany
  • fYear
    2008
  • fDate
    17-20 Dec. 2008
  • Firstpage
    232
  • Lastpage
    237
  • Abstract
    The concept of design patterns has been widely used in the software and hardware domain. Several fault tolerance patterns have been proposed to document widely used fault tolerance methods. In this paper, we propose a new software fault tolerance pattern, which is called recovery block with backup voting pattern. This pattern can be used to improve the software reliability of the classical recovery block pattern in applications in which the construction of an effective acceptance test can not be guaranteed. In order to represent the new pattern, we use a pattern representation that focuses on the nonfunctional consequences of the design patterns on safety critical embedded systems. These nonfunctional consequences contain: safety, reliability, modifiability, cost, and execution time. Among other side effects, the implications part of the new pattern shows that it is resulting in higher reliability than the classical recovery block with relatively low additional hardware cost.
  • Keywords
    embedded systems; object-oriented programming; program testing; safety-critical software; software fault tolerance; system recovery; design pattern; nonfunctional consequence; pattern representation; recovery block backup voting pattern; safety critical embedded system; software fault tolerance; software reliability; Costs; Embedded software; Embedded system; Fault tolerance; Hardware; Software design; Software reliability; Software safety; Testing; Voting; Backup Voting; Design Pattern; Recovery Block; Safety Critical;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology, 2008. ICIT '08. International Conference on
  • Conference_Location
    Bhubaneswar
  • Print_ISBN
    978-1-4244-3745-0
  • Type

    conf

  • DOI
    10.1109/ICIT.2008.60
  • Filename
    4731332