DocumentCode :
2089935
Title :
Characterization of thin films of ZnO prepared by sol-gel processes
Author :
Bahadur, H. ; Kishore, R. ; Sood, K.N. ; Rashmi ; Sharma, R.K. ; Basu, A. ; Haranath, D. ; Chander, H. ; Chandra, S.
Author_Institution :
Nat. Phys. Lab., New Delhi
fYear :
2004
fDate :
5-7 April 2004
Firstpage :
87
Lastpage :
91
Abstract :
Thin films of ZnO have been grown using sol-gel technique. The precursor materials for sol preparation include zinc acetate or zinc nitrate. Characterization was done using optical absorption, ellipsometry, X-ray diffraction, photoluminescence and scanning electron microscopy.
Keywords :
X-ray diffraction; light absorption; photoluminescence; scanning electron microscopy; sol-gel processing; thin films; zinc compounds; X-ray diffraction; ZnO; ellipsometry; optical absorption; photoluminescence microscopy; precursor materials; scanning electron microscopy; sol-gel processes; thin film characterization; zinc acetate; zinc nitrate; Electron Microscopy; Ellipsometry; Thin films; XRD; Zinc oxide; sol-gel;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Frequency and Time Forum, 2004. EFTF 2004. 18th European
Conference_Location :
Guildford
ISSN :
0537-9989
Print_ISBN :
0-86341-384-6
Type :
conf
Filename :
5074914
Link To Document :
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