DocumentCode
2089938
Title
A mathematical model to predict the optimal test line location and sample volume for lateral flow immunoassays
Author
Ragavendar, M.S. ; Anmol, C.M.
Author_Institution
Siemens Corp. Res. & Technol., Bangalore, India
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
2408
Lastpage
2411
Abstract
Lateral flow immunoassay (LFIA) platform is one of the most relevant technologies for screening and diagnosing clinical conditions [1]. However due to low sensitivity and poor repeatability of the platform it has been used only for limited and non-critical tests [2] [5]. Mathematical models have been used to understand the principles of capillary flow and antibody antigen based immuno reactions in nitrocellulose membrane typically seen in LFIA [4]. The model presented in this paper predicts the optimized location of test line on LFIA strip, sample volume and total reaction time that is needed to achieve the required sensitivity for different analytes on a case to case basis. The membrane properties like capillary flow time (s/cm), concentration and affinity constants of antibodies can be varied and the corresponding effect on strip design can be found. Hence this model can be used as a design tool to optimize the LFIA strip construction and reagent development processes.
Keywords
biological techniques; biomembrane transport; capillarity; microfluidics; LFIA platform; antibody antigen based immuno reaction; capillary flow; lateral flow immunoassay; nitrocellulose membrane; optimal test line location; repeatability; sample volume; sensitivity; total reaction time; Equations; Immune system; Mathematical model; Optimized production technology; Sensitivity; Strips; Capillary Action; Computer Simulation; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Immunoassay; Membranes, Artificial; Models, Theoretical; Reagent Strips; Rheology;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6346449
Filename
6346449
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