Title :
Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets
Author :
Spyronasios, A.D. ; Dimopoulos, M.G. ; Papadopoulos, N.P. ; Hatzopoulos, A.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
Abstract :
In this paper a test method for testing both parametric and catastrophic faults in analog and mixed signal Integrated Circuits (ICs) is presented. It is based on the wavelet transformation of the measured signal, be it supply current (IPS) or output voltage (VOUT) waveform. The tolerance limit for the good or reference IC is set by statistical processing data obtained from a set of fault-free ICs. In the wavelet analysis, two test metrics one named discrimination factor and one utilizing Mahalanobis distances are introduced. Both metrics rely on wavelet energy computation. Results from the application of the proposed method in testing known analog and mixed signal IC benchmarks are presented showing the effectiveness of the proposed testing scheme.
Keywords :
integrated circuit testing; mixed analogue-digital integrated circuits; wavelet transforms; Mahalanobis distances; analog integrated circuits; catastrophic faults; fault-free IC; mixed signal integrated circuits; mixed-signal integrated circuits; output voltage waveform; parametric faults; statistical processing data; supply current; wavelet analysis; wavelet energy computation; wavelet transformation; Circuit faults; Integrated circuits; Measurement; Operational amplifiers; Testing; Wavelet transforms; Circuit Testing; Mahalanobis Distance; Mixed-Signal Integrated Circuit Testing; Wavelets;
Conference_Titel :
VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on
Conference_Location :
Lixouri, Kefalonia
Print_ISBN :
978-1-4244-7321-2
DOI :
10.1109/ISVLSI.2010.36
